|
Search the dblp DataBase
Owen Farnsworth:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- Bernd Könemann, Carl Barnhart, Brion L. Keller, Tom Snethen, Owen Farnsworth, Donald L. Wheater
A SmartBIST Variant with Guaranteed Encoding. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2001, pp:325-0 [Conf]
- Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Brion L. Keller, Bernd Könemann, Andrej Ferko
OPMISR: the foundation for compressed ATPG vectors. [Citation Graph (0, 0)][DBLP] ITC, 2001, pp:748-757 [Conf]
- Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater
On-Chip Repair and an ATE Independent Fusing Methodology. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:178-186 [Conf]
- Darren Anand, Bruce Cowan, Owen Farnsworth, Peter Jakobsen, Steven F. Oakland, Michael Ouellette, Donald L. Wheater
An On-Chip Self-Repair Calculation and Fusing Methodology. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2003, v:20, n:5, pp:67-75 [Journal]
- Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera
Extending OPMISR beyond 10x Scan Test Efficiency. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2002, v:19, n:5, pp:65-72 [Journal]
Search in 0.001secs, Finished in 0.002secs
|