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Seiken Yano: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yoshihiro Konno, Kazushi Nakamura, Tatsushige Bitoh, Koji Saga, Seiken Yano
    A Consistent Scan Design System for Large-Scale ASICs. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1996, pp:82-87 [Conf]
  2. Seiken Yano
    Unified scan design with scannable memory arrays. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:153-159 [Conf]

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