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Prabhu Krishnamurthy:
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- Prabhu Krishnamurthy
The Ultimate Chase. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2005, pp:454- [Conf]
- Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. [Citation Graph (0, 0)][DBLP] ITC, 2004, pp:1285-1294 [Conf]
- Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
Impact of Multiple-Detect Test Patterns on Product Quality. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:1031-1040 [Conf]
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