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Publications of Author

1. Jishun Kuang, Yu Wang, Xiaofen Wei, Changnian Zhang
   IDDT ATPG Based on Ambiguous Delay Assignments. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2003, pp:400-405 [Conf]
   
2. Yinghua Min, Jishun Kuang, Xiaoyan Niu
   At-Speed Current Testing. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2003, pp:396-399 [Conf]
   
3. Zhang Ling, Kuang Jishun
   A New BIST Solution for System-on-Chip. [Citation Graph (0, 0)][DBLP]
   PRDC, 2005, pp:109-113 [Conf]
   
4. Jishun Kuang, Zhiqiang Yang, Qijian Zhu, Yinghua Min
   IDDT: Fundamentals and Test Generation. [Citation Graph (0, 0)][DBLP]
   J. Comput. Sci. Technol., 2003, v:18, n:3, pp:299-307 [Journal]
   
5. 
   Test Response Data Volume and Wire Length Reductions for Extended Compatibilities Scan Tree Construction. [Citation Graph (, )][DBLP]
   
   
6. 
   Test Data Compression Using Four-Coded and Sparse Storage for Testing Embedded Core. [Citation Graph (, )][DBLP]
   
   
7. 
   Small Delay Fault Simulation for Sequential Circuits. [Citation Graph (, )][DBLP]