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Publications of Author

1. Norio Kuji
   Guided-Probe Diagnosis of Macro-Cell-Designed LSI Circuits. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1997, pp:174-0 [Conf]
   
2. Norio Kuji, Takako Ishihara
   EB-Testing-Pad Method and Its Evaluation by Actual Devices. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2001, pp:179-184 [Conf]
   
3. Norio Kuji, Teruo Tamama
   Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. [Citation Graph (0, 0)][DBLP]
   ITC, 1985, pp:643-651 [Conf]
   
4. Norio Kuji, Teruo Tamama
   An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs. [Citation Graph (0, 0)][DBLP]
   ITC, 1986, pp:857-863 [Conf]
   
5. Norio Kuji, Teruo Tamama, M. Nagatani
   FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:2, pp:313-319 [Journal]