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Il-soo Lee: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Il-soo Lee, Yong Min Hur, Tony Ambler
    The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:94-97 [Conf]
  2. Geewhun Seok, Il-soo Lee, Tony Ambler, B. F. Womack
    An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:145-156 [Conf]
  3. Il-soo Lee, Tony Ambler
    Two efficient methods to reduce power and testing time. [Citation Graph (0, 0)][DBLP]
    ISLPED, 2005, pp:167-172 [Conf]
  4. Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler
    Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2005, pp:194-199 [Conf]
  5. Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler
    Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. [Citation Graph (0, 0)][DBLP]
    ISVLSI, 2005, pp:255-256 [Conf]

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