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Tony Ambler: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Il-soo Lee, Yong Min Hur, Tony Ambler
    The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:94-97 [Conf]
  2. Geewhun Seok, Il-soo Lee, Tony Ambler, B. F. Womack
    An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:145-156 [Conf]
  3. Il-soo Lee, Tony Ambler
    Two efficient methods to reduce power and testing time. [Citation Graph (0, 0)][DBLP]
    ISLPED, 2005, pp:167-172 [Conf]
  4. Yu-Ting Lin, Tony Ambler
    An Economic Selecting Model for DFT Strategies. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:412-417 [Conf]
  5. Tony Ambler
    Test Strategies and Marriage Partners. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:5, pp:128-0 [Journal]
  6. Tony Ambler, Magdy S. Abadir
    Design and Test Economics-An Extra Dimension. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:15-16 [Journal]
  7. Tony Ambler, Ben Bennetts
    Guest Editors' Introduction: Test and the Product Life Cycle. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:3, pp:20-22 [Journal]
  8. Tony Ambler, Donald L. Wheater
    Test Trade-Offs Take Center Stage at ITC. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:5, pp:59-0 [Journal]
  9. Louis Y. Ungar, Tony Ambler
    Economics of Built-in Self-Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2001, v:18, n:5, pp:70-79 [Journal]

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