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Rafic Z. Makki: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jian Liu, Rafic Z. Makki, Ayman I. Kayssi
    Dynamic Power Supply Current Testing of SRAMs. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:348-353 [Conf]
  2. Rafic Z. Makki
    Testing of Embedded Memories - The Aggregate. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:519- [Conf]
  3. Jian Liu, Rafic Z. Makki
    Power supply current detectability of SRAM defects. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:367-0 [Conf]
  4. Suriya Ashok Kumar, Rafic Z. Makki, David Binkley
    IDDT Testing of Embedded CMOS SRAMs. [Citation Graph (0, 0)][DBLP]
    DATE, 2002, pp:1117- [Conf]
  5. Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu
    IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    DELTA, 2002, pp:403-407 [Conf]
  6. Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala
    Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:195-202 [Conf]
  7. Rafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene
    On the Integration of Design and Manufacturing for Improved Testability. [Citation Graph (0, 0)][DBLP]
    ITC, 1991, pp:248-255 [Conf]
  8. Rafic Z. Makki, Shyang-Tai Su, Troy Nagle
    Transient Power Supply Current Testing of Digital CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:892-901 [Conf]
  9. Rafic Z. Makki, C. Tiansheng
    Designing Testable Control Paths with Multiple and Feedback Scan-Paths. [Citation Graph (0, 0)][DBLP]
    ITC, 1986, pp:484-492 [Conf]
  10. Rafic Z. Makki, Silvio Bou-Ghazale, Chen Tianshang
    Automatic Test Pattern Generation with Branch Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1991, v:40, n:6, pp:785-791 [Journal]
  11. Ali Chehab, Saurabh Patel, Rafic Z. Makki
    Scaling of iDDT Test Methods for Random Logic Circuits. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:1, pp:11-22 [Journal]

  12. On Wires Holding a Handful of Electrons. [Citation Graph (, )][DBLP]


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