The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Shyue-Kung Lu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Shyue-Kung Lu, Chung-Yang Chen
    Fault Detection and Fault Diagnosis Technoques for Lookup Table FPGA's. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:236-241 [Conf]
  2. Shyue-Kung Lu, Tsung-Ying Lee, Cheng-Wen Wu
    Defect Level Prediction Using Multi-Model Fault Coverage. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1999, pp:301-0 [Conf]
  3. Shyue-Kung Lu, Jeh-Sheng Shih, Cheng-Wen Wu
    A Testable/Fault Tolerant FFT Processor Design. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2000, pp:429-0 [Conf]
  4. Shyue-Kung Lu, Hung-Chin Wu, Shoei-Jia Yan, Yu-Cheng Tsai
    Testing and Diagnosis Techniques for LUT-Based FPGA's. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:414-419 [Conf]
  5. Shyue-Kung Lu, Chien-Hung Yeh
    Easily Testable and Fault-Tolerant Design of FFT Butterfly Networks. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:230-0 [Conf]
  6. Shyue-Kung Lu, Mau-Jung Lu
    Enhancing Delay Fault Testability for FIR Filters Based on Realistic Sequential Cell Fault Model. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:416-418 [Conf]
  7. Cheng-Wen Wu, Shyue-Kung Lu
    Designing Self-Testable Cellular Arrays. [Citation Graph (0, 0)][DBLP]
    ICCD, 1991, pp:110-113 [Conf]
  8. Shyue-Kung Lu, Jian-Long Chen, Cheng-Wen Wu, Ken-Feng Chang, Shi-Yu Huang
    Combinational circuit fault diagnosis using logic emulation. [Citation Graph (0, 0)][DBLP]
    ISCAS (5), 2003, pp:549-552 [Conf]
  9. Shyue-Kung Lu, Chih-Hsien Hsu
    Built-In self-repair for divided word line memory. [Citation Graph (0, 0)][DBLP]
    ISCAS (4), 2001, pp:13-16 [Conf]
  10. Shyue-Kung Lu, Cheng-Wen Wu
    A novel approach to testing LUT-based FPGAs. [Citation Graph (0, 0)][DBLP]
    ISCAS (1), 1999, pp:173-177 [Conf]
  11. Shyue-Kung Lu, Shih-Chang Huang
    Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs. [Citation Graph (0, 0)][DBLP]
    MTDT, 2004, pp:60-64 [Conf]
  12. Shyue-Kung Lu, Chien-Hung Yeh
    Enhancing Delay Fault Testability for Iterative Logic Array. [Citation Graph (0, 0)][DBLP]
    PRDC, 2002, pp:283-292 [Conf]
  13. Shyue-Kung Lu, Chien-Hung Yeh, Han-Wen Lin
    Efficient Built-in Self-Test Techniques for Memory-Based FFT Processors. [Citation Graph (0, 0)][DBLP]
    PRDC, 2004, pp:321-326 [Conf]
  14. Chih-Hsien Hsu, Shyue-Kung Lu, Sy-Yen Kuo
    Novel Fault-Tolerant Techniques for High Capacity RAMs. [Citation Graph (0, 0)][DBLP]
    PRDC, 2001, pp:11-18 [Conf]
  15. Shyue-Kung Lu, Ting-Yu Chen, Wei-Yuan Liu
    Efficient Built-In Self-Test Schemes for Video Coding Cores: a Case Study on DCT/IDCT Circuits. [Citation Graph (0, 0)][DBLP]
    PRDC, 2006, pp:97-104 [Conf]
  16. Ming-Wei Wu, Yennun Huang, Shyue-Kung Lu, Ing-Yi Chen, Sy-Yen Kuo
    A Multi-Faceted Approach towards Spam-Resistible Mail. [Citation Graph (0, 0)][DBLP]
    PRDC, 2005, pp:208-218 [Conf]
  17. Ming-Wei Wu, Yennun Huang, Ing-Yi Chen, Shyue-Kung Lu, Sy-Yen Kuo
    A Scalable Port Forwarding for P2P-Based Wi-Fi Applications. [Citation Graph (0, 0)][DBLP]
    WASA, 2006, pp:26-37 [Conf]
  18. Hong-Chou Kao, Ming-Fu Tsai, Shi-Yu Huang, Cheng-Wen Wu, Wen-Feng Chang, Shyue-Kung Lu
    Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults. [Citation Graph (0, 0)][DBLP]
    J. Inf. Sci. Eng., 2003, v:19, n:4, pp:571-587 [Journal]
  19. Shyue-Kung Lu, Jen-Sheng Shih
    Testing Configurable LUT-Based FPGAs. [Citation Graph (0, 0)][DBLP]
    J. Inf. Sci. Eng., 2000, v:16, n:5, pp:733-750 [Journal]
  20. Shyue-Kung Lu, Sy-Yen Kuo, Cheng-Wen Wu
    Fault-Tolerant Interleaved Memory Systems with Two-Level Redundancy. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1997, v:46, n:9, pp:1028-1034 [Journal]
  21. Shyue-Kung Lu, Jen-Sheng Shih, Shih-Chang Huang
    Design-for-testability and fault-tolerant techniques for FFT processors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2005, v:13, n:6, pp:732-741 [Journal]
  22. Shyue-Kung Lu, Yu-Chen Tsai, Chih-Hsien Hsu, Kuo-Hua Wang, Cheng-Wen Wu
    Efficient built-in redundancy analysis for embedded memories with 2-D redundancy. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2006, v:14, n:1, pp:34-42 [Journal]
  23. Shyue-Kung Lu, Chih-Hsien Hsu
    Fault tolerance techniques for high capacity RAM. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:293-306 [Journal]
  24. Shyue-Kung Lu, Jen-Chuan Wang, Cheng-Wen Wu
    C-testable design techniques for iterative logic arrays. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1995, v:3, n:1, pp:146-152 [Journal]

  25. Efficient BISR Techniques for Embedded Memories Considering Cluster Faults. [Citation Graph (, )][DBLP]


  26. Built-In Self-Repair Techniques for Heterogeneous Memory Cores. [Citation Graph (, )][DBLP]


  27. Fault-tolerance design of memory systems based on DBL structures. [Citation Graph (, )][DBLP]


Search in 0.002secs, Finished in 0.305secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002