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Shyue-Kung Lu:
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Publications of Author
- Shyue-Kung Lu, Chung-Yang Chen
Fault Detection and Fault Diagnosis Technoques for Lookup Table FPGA's. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2002, pp:236-241 [Conf]
- Shyue-Kung Lu, Tsung-Ying Lee, Cheng-Wen Wu
Defect Level Prediction Using Multi-Model Fault Coverage. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 1999, pp:301-0 [Conf]
- Shyue-Kung Lu, Jeh-Sheng Shih, Cheng-Wen Wu
A Testable/Fault Tolerant FFT Processor Design. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2000, pp:429-0 [Conf]
- Shyue-Kung Lu, Hung-Chin Wu, Shoei-Jia Yan, Yu-Cheng Tsai
Testing and Diagnosis Techniques for LUT-Based FPGA's. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2004, pp:414-419 [Conf]
- Shyue-Kung Lu, Chien-Hung Yeh
Easily Testable and Fault-Tolerant Design of FFT Butterfly Networks. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2002, pp:230-0 [Conf]
- Shyue-Kung Lu, Mau-Jung Lu
Enhancing Delay Fault Testability for FIR Filters Based on Realistic Sequential Cell Fault Model. [Citation Graph (0, 0)][DBLP] DELTA, 2004, pp:416-418 [Conf]
- Cheng-Wen Wu, Shyue-Kung Lu
Designing Self-Testable Cellular Arrays. [Citation Graph (0, 0)][DBLP] ICCD, 1991, pp:110-113 [Conf]
- Shyue-Kung Lu, Jian-Long Chen, Cheng-Wen Wu, Ken-Feng Chang, Shi-Yu Huang
Combinational circuit fault diagnosis using logic emulation. [Citation Graph (0, 0)][DBLP] ISCAS (5), 2003, pp:549-552 [Conf]
- Shyue-Kung Lu, Chih-Hsien Hsu
Built-In self-repair for divided word line memory. [Citation Graph (0, 0)][DBLP] ISCAS (4), 2001, pp:13-16 [Conf]
- Shyue-Kung Lu, Cheng-Wen Wu
A novel approach to testing LUT-based FPGAs. [Citation Graph (0, 0)][DBLP] ISCAS (1), 1999, pp:173-177 [Conf]
- Shyue-Kung Lu, Shih-Chang Huang
Built-in Self-Test and Repair (BISTR) Techniques for Embedded RAMs. [Citation Graph (0, 0)][DBLP] MTDT, 2004, pp:60-64 [Conf]
- Shyue-Kung Lu, Chien-Hung Yeh
Enhancing Delay Fault Testability for Iterative Logic Array. [Citation Graph (0, 0)][DBLP] PRDC, 2002, pp:283-292 [Conf]
- Shyue-Kung Lu, Chien-Hung Yeh, Han-Wen Lin
Efficient Built-in Self-Test Techniques for Memory-Based FFT Processors. [Citation Graph (0, 0)][DBLP] PRDC, 2004, pp:321-326 [Conf]
- Chih-Hsien Hsu, Shyue-Kung Lu, Sy-Yen Kuo
Novel Fault-Tolerant Techniques for High Capacity RAMs. [Citation Graph (0, 0)][DBLP] PRDC, 2001, pp:11-18 [Conf]
- Shyue-Kung Lu, Ting-Yu Chen, Wei-Yuan Liu
Efficient Built-In Self-Test Schemes for Video Coding Cores: a Case Study on DCT/IDCT Circuits. [Citation Graph (0, 0)][DBLP] PRDC, 2006, pp:97-104 [Conf]
- Ming-Wei Wu, Yennun Huang, Shyue-Kung Lu, Ing-Yi Chen, Sy-Yen Kuo
A Multi-Faceted Approach towards Spam-Resistible Mail. [Citation Graph (0, 0)][DBLP] PRDC, 2005, pp:208-218 [Conf]
- Ming-Wei Wu, Yennun Huang, Ing-Yi Chen, Shyue-Kung Lu, Sy-Yen Kuo
A Scalable Port Forwarding for P2P-Based Wi-Fi Applications. [Citation Graph (0, 0)][DBLP] WASA, 2006, pp:26-37 [Conf]
- Hong-Chou Kao, Ming-Fu Tsai, Shi-Yu Huang, Cheng-Wen Wu, Wen-Feng Chang, Shyue-Kung Lu
Efficient Double Fault Diagnosis for CMOS Logic Circuits With a Specific Application to Generic Bridging Faults. [Citation Graph (0, 0)][DBLP] J. Inf. Sci. Eng., 2003, v:19, n:4, pp:571-587 [Journal]
- Shyue-Kung Lu, Jen-Sheng Shih
Testing Configurable LUT-Based FPGAs. [Citation Graph (0, 0)][DBLP] J. Inf. Sci. Eng., 2000, v:16, n:5, pp:733-750 [Journal]
- Shyue-Kung Lu, Sy-Yen Kuo, Cheng-Wen Wu
Fault-Tolerant Interleaved Memory Systems with Two-Level Redundancy. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 1997, v:46, n:9, pp:1028-1034 [Journal]
- Shyue-Kung Lu, Jen-Sheng Shih, Shih-Chang Huang
Design-for-testability and fault-tolerant techniques for FFT processors. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2005, v:13, n:6, pp:732-741 [Journal]
- Shyue-Kung Lu, Yu-Chen Tsai, Chih-Hsien Hsu, Kuo-Hua Wang, Cheng-Wen Wu
Efficient built-in redundancy analysis for embedded memories with 2-D redundancy. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2006, v:14, n:1, pp:34-42 [Journal]
- Shyue-Kung Lu, Chih-Hsien Hsu
Fault tolerance techniques for high capacity RAM. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2006, v:55, n:2, pp:293-306 [Journal]
- Shyue-Kung Lu, Jen-Chuan Wang, Cheng-Wen Wu
C-testable design techniques for iterative logic arrays. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 1995, v:3, n:1, pp:146-152 [Journal]
Efficient BISR Techniques for Embedded Memories Considering Cluster Faults. [Citation Graph (, )][DBLP]
Built-In Self-Repair Techniques for Heterogeneous Memory Cores. [Citation Graph (, )][DBLP]
Fault-tolerance design of memory systems based on DBL structures. [Citation Graph (, )][DBLP]
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