The SCEAS System
Navigation Menu
Introduction
Collection Based
Clustering
Ranking
Paper Based
Journals
Conferences
DB Status
Statistics
Search

Search the dblp DataBase

Title:
Author:
J. Th. van der Linden: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor
    Circuit Partitioned Automatic Test Pattern Generation Constrained by Three-State Buses and Restrictors. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1996, pp:29-33 [Conf]
  2. J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor
    Complete Search in Test Generation for Industrial Circuits with Improved Bus-Conflict Detection. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1998, pp:212-0 [Conf]
  3. M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor
    Illegal State Space Identification for Sequential Circuit Test Generation. [Citation Graph (0, 0)][DBLP]
    DATE, 1999, pp:741-746 [Conf]
  4. M. J. Geuzebroek, J. Th. van der Linden, A. J. van de Goor
    Test point insertion for compact test sets. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:292-301 [Conf]
  5. M. J. Geuzebroek, J. Th. van der Linden, A. J. van de Goor
    Test Point Insertion that Facilitates ATPG in Reducing Test Time and Data Volume. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:138-147 [Conf]
  6. M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor
    Test Pattern Generation with Restrictors. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:598-605 [Conf]
  7. M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor
    Accelerated Compact Test Set Generation for Three-State Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:29-38 [Conf]
  8. M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor
    Sequential Test Generation with Advanced Illegal State Search. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:733-742 [Conf]
  9. M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor
    Testability of the Philips 80C51 micro-controller. [Citation Graph (0, 0)][DBLP]
    ITC, 1999, pp:820-829 [Conf]
  10. J. Th. van der Linden, M. H. Konijnenburg, A. J. van de Goor
    Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional I/O. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:604-613 [Conf]
  11. M. H. Konijnenburg, J. Th. van der Linden, A. J. van de Goor
    Compact test sets for industrial circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:358-366 [Conf]

Search in 0.001secs, Finished in 0.002secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
Introduction Collection Based Clustering Ranking Paper Based Journals Conferences DB Status Statistics Search
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002