The SCEAS System
Navigation Menu

Search the dblp DataBase


Udo Mahlstedt: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
    Deterministic test generation for non-classical faults on the gate level. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:244-251 [Conf]
  2. Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners
    DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:194-197 [Conf]
  3. Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn
    Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1990, pp:222-225 [Conf]
  4. Udo Mahlstedt
    DELTEST: Deterministic Test Generation for Gate-Delay Faults. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:972-980 [Conf]
  5. Udo Mahlstedt, Jürgen Alt
    Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:883-892 [Conf]
  6. Udo Mahlstedt, Jürgen Alt, Matthias Heinitz
    CURRENT: a test generation system for I/sub DDQ/ testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:317-323 [Conf]

  7. Accelerated test pattern generation by cone-oriented circuit partitioning. [Citation Graph (, )][DBLP]

Search in 0.002secs, Finished in 0.002secs
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
System created by [] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002