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Udo Mahlstedt: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Udo Mahlstedt, Jürgen Alt, Ingo Hollenbeck
    Deterministic test generation for non-classical faults on the gate level. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:244-251 [Conf]
  2. Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners
    DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:194-197 [Conf]
  3. Udo Mahlstedt, Torsten Grüning, Cengiz Özcan, Wilfried Daehn
    Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1990, pp:222-225 [Conf]
  4. Udo Mahlstedt
    DELTEST: Deterministic Test Generation for Gate-Delay Faults. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:972-980 [Conf]
  5. Udo Mahlstedt, Jürgen Alt
    Simulation of non-classical Faults on the Gate Level - The Fault Simulator COMISM -. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:883-892 [Conf]
  6. Udo Mahlstedt, Jürgen Alt, Matthias Heinitz
    CURRENT: a test generation system for I/sub DDQ/ testing. [Citation Graph (0, 0)][DBLP]
    VTS, 1995, pp:317-323 [Conf]

  7. Accelerated test pattern generation by cone-oriented circuit partitioning. [Citation Graph (, )][DBLP]


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