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Publications of Author

1. Hans A. R. Manhaeve
   Current Testing for Nanotechnologies: A Demystifying Application Perspective.. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:456- [Conf]
   
2. Viera Stopjaková, Hans A. R. Manhaeve, M. Sidiropulos
   On-Chip Transient Current Monitor for Testing of Low Voltage CMOS IC. [Citation Graph (0, 0)][DBLP]
   DATE, 1999, pp:538-542 [Conf]
   
3. B. Straka, Hans A. R. Manhaeve, Jozef Vanneuville, M. Svajda
   A Fully Digital Controlled Off-Chip IDDQ Measurement Unit. [Citation Graph (0, 0)][DBLP]
   DATE, 1998, pp:495-500 [Conf]
   
4. M. Svajda, B. Straka, Hans A. R. Manhaeve
   IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit. [Citation Graph (0, 0)][DBLP]
   DATE, 1998, pp:959-960 [Conf]
   
5. Hans A. R. Manhaeve, Stefaan Kerckenaere
   An On-Chip Detection Circuit for the Verification of IC Supply Connections. [Citation Graph (0, 0)][DBLP]
   DFT, 2001, pp:57-65 [Conf]
   
6. Hans A. R. Manhaeve, Paul L. Wrighton, Jos van Sas, Urbain Swerts
   An Off-chip I_DDQ Current Measurement Unit for Telecommunication ASICs. [Citation Graph (0, 0)][DBLP]
   ITC, 1994, pp:203-212 [Conf]
   
7. Hans A. R. Manhaeve
   Current testing for nanotechnologies: Myths, facts, and figures. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:3, pp:264-0 [Journal]
   
8. 
   Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality. [Citation Graph (, )][DBLP]
   
   
9. 
   CCII+ current conveyor based BIC monitor for I_DDQ testing of complex CMOS circuits. [Citation Graph (, )][DBLP]
   
   
10. 
    A monolithic off-chip IDDQ monitor. [Citation Graph (, )][DBLP]
    
    
11. 
    The Quest for Test: Will Redundancy Cover All? [Citation Graph (, )][DBLP]