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Hiromu Fujioka :
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Katsuyoshi Miura , Koji Nakamae , Hiromu Fujioka Intelligent EB Test System for Automatic VLSI Fault Tracing. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1999, pp:335-341 [Conf ] Katsuyoshi Miura , Kohei Nakata , Koji Nakamae , Hiromu Fujioka Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data. [Citation Graph (0, 0)][DBLP ] Asian Test Symposium, 1997, pp:162-167 [Conf ] Hiromu Fujioka , Koji Nakamae , Akio Higashi Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and Cost. [Citation Graph (0, 0)][DBLP ] ITC, 1996, pp:793-799 [Conf ] Youhei Zenda , Koji Nakamae , Hiromu Fujioka Cost Optimum Embedded DRAM Design by Yield Analysis. [Citation Graph (0, 0)][DBLP ] MTDT, 2003, pp:20-0 [Conf ] Koji Nakamae , Homare Sakamoto , Hiromu Fujioka How ATE Planning Affects LSI Manufacturing Cost. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1996, v:13, n:4, pp:66-73 [Journal ] Koji Nakamae , Takashi Ishimura , Hiromu Fujioka EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. [Citation Graph (0, 0)][DBLP ] Systems and Computers in Japan, 2000, v:31, n:8, pp:41-48 [Journal ] Koji Nakamae , Shinji Yokoyama , Atsushi Onishi , Hiromu Fujioka Knowledge-based circuit recognition from standard-cell design CMOS VLSI optical microscope images. [Citation Graph (0, 0)][DBLP ] Systems and Computers in Japan, 1998, v:29, n:4, pp:70-78 [Journal ] Katsuyoshi Miura , Koji Nakamae , Hiromu Fujioka Development of an EB/FIB Integrated Test System. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1489-1494 [Journal ] Katsuyoshi Miura , Koji Nakamae , Hiromu Fujioka CAD navigation system, for backside waveform probing of CMOS devices. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2002, v:42, n:9-11, pp:1679-1684 [Journal ] Katsuyoshi Miura , Tomoyuki Kobatake , Koji Nakamae , Hiromu Fujioka A low energy FIB processing, repair, and test system. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2003, v:43, n:9-11, pp:1627-1631 [Journal ] Koji Nakamae , Masaki Chikahisa , Hiromu Fujioka Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection. [Citation Graph (0, 0)][DBLP ] Image Vision Comput., 2007, v:25, n:7, pp:1117-1123 [Journal ] Search in 0.003secs, Finished in 0.004secs