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Hiromu Fujioka: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
    Intelligent EB Test System for Automatic VLSI Fault Tracing. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1999, pp:335-341 [Conf]
  2. Katsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka
    Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:162-167 [Conf]
  3. Hiromu Fujioka, Koji Nakamae, Akio Higashi
    Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and Cost. [Citation Graph (0, 0)][DBLP]
    ITC, 1996, pp:793-799 [Conf]
  4. Youhei Zenda, Koji Nakamae, Hiromu Fujioka
    Cost Optimum Embedded DRAM Design by Yield Analysis. [Citation Graph (0, 0)][DBLP]
    MTDT, 2003, pp:20-0 [Conf]
  5. Koji Nakamae, Homare Sakamoto, Hiromu Fujioka
    How ATE Planning Affects LSI Manufacturing Cost. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1996, v:13, n:4, pp:66-73 [Journal]
  6. Koji Nakamae, Takashi Ishimura, Hiromu Fujioka
    EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 2000, v:31, n:8, pp:41-48 [Journal]
  7. Koji Nakamae, Shinji Yokoyama, Atsushi Onishi, Hiromu Fujioka
    Knowledge-based circuit recognition from standard-cell design CMOS VLSI optical microscope images. [Citation Graph (0, 0)][DBLP]
    Systems and Computers in Japan, 1998, v:29, n:4, pp:70-78 [Journal]
  8. Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
    Development of an EB/FIB Integrated Test System. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:9-10, pp:1489-1494 [Journal]
  9. Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka
    CAD navigation system, for backside waveform probing of CMOS devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:9-11, pp:1679-1684 [Journal]
  10. Katsuyoshi Miura, Tomoyuki Kobatake, Koji Nakamae, Hiromu Fujioka
    A low energy FIB processing, repair, and test system. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:9-11, pp:1627-1631 [Journal]
  11. Koji Nakamae, Masaki Chikahisa, Hiromu Fujioka
    Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection. [Citation Graph (0, 0)][DBLP]
    Image Vision Comput., 2007, v:25, n:7, pp:1117-1123 [Journal]

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