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Kenta Terashima: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy
    On Improving Defect Coverage of Stuck-at Fault Tests. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:216-223 [Conf]

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