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Publications of Author

1. Mohammad Gh. Mohammad, Kewal K. Saluja
   Stress Test for Disturb Faults in Non-Volatile Memories. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2003, pp:384-389 [Conf]
   
2. Mohammad Gh. Mohammad, Kewal K. Saluja
   Electrical Model For Program Disturb Faults in Non-Volatile Memories. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2003, pp:217-222 [Conf]
   
3. Mohammad Gh. Mohammad, Kewal K. Saluja, Alex Yap
   Testing Flash Memories. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2000, pp:406-411 [Conf]
   
4. Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasman
   A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity. [Citation Graph (0, 0)][DBLP]
   VLSI Design, 2006, pp:100-107 [Conf]
   
5. Mohammad Gh. Mohammad, Kewal K. Saluja
   Flash Memory Disturbances: Modeling and Test. [Citation Graph (0, 0)][DBLP]
   VTS, 2001, pp:218-224 [Conf]
   
6. Mohammad Gh. Mohammad, Kewal K. Saluja
   Optimizing program disturb fault tests using defect-based testing. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:6, pp:905-915 [Journal]
   
7. Mohammad Gh. Mohammad, Laila Terkawi
   Techniques for Disturb Fault Collapsing. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:363-368 [Journal]
   
8. 
   Testing Flash Memories for Tunnel Oxide Defects. [Citation Graph (, )][DBLP]
   
   
9. 
   Test power reduction in compression-based reconfigurable scan architectures. [Citation Graph (, )][DBLP]
   
   
10. 
    Frequency assignment problem in satellite communications using differential evolution. [Citation Graph (, )][DBLP]