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Gurjeet S. Saund: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal
    A STAFAN-like functional testability measure for register-level circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:192-198 [Conf]
  2. Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel
    Partial Scan beyond Cycle Cutting. [Citation Graph (0, 0)][DBLP]
    FTCS, 1997, pp:320-328 [Conf]
  3. Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel
    Partial Scan Selection Based on Dynamic Reachability and Observability Information. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1998, pp:174-180 [Conf]

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