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Ben Mathew: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Junji Mori, Ben Mathew, Dave Burns, Yeuk-Hai Mok
    Testability Features of R10000 Microprocessor. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:108-111 [Conf]
  2. Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams
    Accurately Determining Bridging Defects from Layout. [Citation Graph (0, 0)][DBLP]
    DDECS, 2007, pp:87-90 [Conf]
  3. Ben Mathew, Daniel G. Saab
    Augmented partial reset. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1993, pp:716-719 [Conf]
  4. Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab
    On Selecting Flip-Flops for Partial Reset. [Citation Graph (0, 0)][DBLP]
    ITC, 1993, pp:1008-1012 [Conf]
  5. Young-Jun Kwon, Ben Mathew, Hong Hao
    FakeFault: a silicon debug software tool for microprocessor embedded memory arrays. [Citation Graph (0, 0)][DBLP]
    ITC, 1998, pp:727-0 [Conf]
  6. Ben Mathew, Daniel G. Saab
    DFT & ATPG: Together Again. [Citation Graph (0, 0)][DBLP]
    ITC, 1995, pp:262-271 [Conf]
  7. Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
    Yield Analysis of Logic Circuits. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:103-108 [Conf]
  8. Peter Wohl, John A. Waicukauski, Sanjay Patel, Cy Hay, Emil Gizdarski, Ben Mathew
    Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:359-365 [Conf]
  9. Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
    Understanding Yield Losses in Logic Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:3, pp:208-215 [Journal]
  10. Ben Mathew, Daniel G. Saab
    Combining multiple DFT schemes with test generation. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:6, pp:685-696 [Journal]

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