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Jean Marc Galliere: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jean Marc Galliere, Michel Renovell, Florence Azaïs, Yves Bertrand
    Delay Testing Viability of Gate Oxide Short Defects. [Citation Graph (0, 0)][DBLP]
    J. Comput. Sci. Technol., 2005, v:20, n:2, pp:195-200 [Journal]

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