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Takaharu Nagumo: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo
    Test Generation for Multiple-Threshold Gate-Delay Fault Model. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:244-0 [Conf]
  2. Takaharu Nagumo, Masahiko Nagai, Takao Nishida, Masayuki Miyoshi, Shunsuke Miyamoto
    VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults. [Citation Graph (0, 0)][DBLP]
    DAC, 1994, pp:510-515 [Conf]
  3. Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo
    Application of High-Quality Built-In Test to Industrial Designs. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:1003-1012 [Conf]
  4. Yasuo Sato, Toyohito Ikeya, Machinobu Nakao, Takaharu Nagumo
    A BIST approach for very deep sub-micron (VDSM) defects. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:283-291 [Conf]

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