|
Search the dblp DataBase
Takaharu Nagumo:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo
Test Generation for Multiple-Threshold Gate-Delay Fault Model. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2001, pp:244-0 [Conf]
- Takaharu Nagumo, Masahiko Nagai, Takao Nishida, Masayuki Miyoshi, Shunsuke Miyamoto
VFSIM: Vectorized Fault Simulator Using a Reduction Technique Excluding Temporarily Unobservable Faults. [Citation Graph (0, 0)][DBLP] DAC, 1994, pp:510-515 [Conf]
- Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo
Application of High-Quality Built-In Test to Industrial Designs. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:1003-1012 [Conf]
- Yasuo Sato, Toyohito Ikeya, Machinobu Nakao, Takaharu Nagumo
A BIST approach for very deep sub-micron (VDSM) defects. [Citation Graph (0, 0)][DBLP] ITC, 2000, pp:283-291 [Conf]
Search in 0.001secs, Finished in 0.001secs
|