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Toshinobu Ono:
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Publications of Author
- Toshinobu Ono, Akira Kozawa, Takashi Kimura, Yoshihiro Konno, Koji Saga
An Application of Partial Scan Techniques to a High-End System LSI Design. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2001, pp:459- [Conf]
- Toshinobu Ono, Kazuo Wakui, Hitoshi Hikima, Yoshiyuki Nakamura, Masaaki Yoshida
Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 1997, pp:122-125 [Conf]
- Toshinobu Ono
Selecting partial scan flip-flops for circuit partitioning. [Citation Graph (0, 0)][DBLP] ICCAD, 1994, pp:646-650 [Conf]
- Toshinobu Ono, Masaaki Yoshida
A Test Generation Method for Sequential Circuits Based on Maximum Utilization of Internal States. [Citation Graph (0, 0)][DBLP] ITC, 1991, pp:75-82 [Conf]
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