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Publications of Author

1. Toshinobu Ono, Kazuo Wakui, Hitoshi Hikima, Yoshiyuki Nakamura, Masaaki Yoshida
   Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1997, pp:122-125 [Conf]
   
2. Toshiharu Asaka, Masaaki Yoshida, Subhrajit Bhattacharya, Sujit Dey
   H-SCAN+: A Practical Low-Overhead RTL Design-for-Testability Technique for Industrial Designs. [Citation Graph (0, 0)][DBLP]
   ITC, 1997, pp:265-274 [Conf]
   
3. Toshinobu Ono, Masaaki Yoshida
   A Test Generation Method for Sequential Circuits Based on Maximum Utilization of Internal States. [Citation Graph (0, 0)][DBLP]
   ITC, 1991, pp:75-82 [Conf]
   
4. Hirotaka Komoda, Masaaki Yoshida, Yoh Yamamoto, Kouji Iwasaki, Ikuko Nakatani, Heiji Watanabe, Kiyoshi Yasutake
   Novel charge neutralization techniques applicable to wide current range of FIB processing in FIB-SEM combined system. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2006, v:46, n:12, pp:2085-2095 [Journal]