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Toyohito Ikeya: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yasuo Sato, M. Sato, K. Tsutsumida, Toyohito Ikeya, M. Kawashima
    A Practical Logic BIST for ASIC Designs. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:457- [Conf]
  2. Yasuo Sato, Toyohito Ikeya, Machinobu Nakao, Takaharu Nagumo
    A BIST approach for very deep sub-micron (VDSM) defects. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:283-291 [Conf]

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