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Takaki Yoshida:
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Publications of Author
- Reisuke Shimoda, Takaki Yoshida, Masafumi Watari, Yasuhiro Toyota, Kiyokazu Nishi, Akira Motohara
Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 1999, pp:347-0 [Conf]
- Takaki Yoshida, Reisuke Shimoda, Takashi Mizokawa, Katsuhiro Hirayama
An effective fault simulation method for core based LSI. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 1997, pp:116-121 [Conf]
- Takaki Yoshida, Masafumi Watari
MD-SCAN Method for Low Power Scan Testing. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2002, pp:80-85 [Conf]
- Takaki Yoshida, Masafumi Watati
A New Approach for Low Power Scan Testing. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:480-487 [Conf]
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