Search the dblp DataBase

Publications of Author

1. Emmanuel Simeu, Ahmad Abdelhay, Mohammad A. Naal
   Robust Self Concurrent Test of Linear Digital Systems. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2001, pp:293-298 [Conf]
   
2. Emmanuel Simeu, Arno W. Peters, Iyad Rayane
   Automatic Design of Optimal Concurrent Fault Detector for Linear Analog Systems. [Citation Graph (0, 0)][DBLP]
   FTCS, 1999, pp:184-191 [Conf]
   
3. Ahmad Abdelhay, Emmanuel Simeu
   Analytical Redundancy Based Approach for Concurrent Fault Detection in Linear Digital Systems. [Citation Graph (0, 0)][DBLP]
   IOLTW, 2000, pp:112-0 [Conf]
   
4. Mohammad A. Naal, M. Rakotoar, Emmanuel Simeu, Chouki Aktouf
   Using Concurrent and Semi-Concurrent On-Line Testing During HLS: An Adaptable Approach. [Citation Graph (0, 0)][DBLP]
   IOLTW, 2002, pp:184- [Conf]
   
5. Mohammad A. Naal, Emmanuel Simeu
   High-Level Synthesis Methodology for On-Line Testability Optimization. [Citation Graph (0, 0)][DBLP]
   IOLTW, 2000, pp:201-206 [Conf]
   
6. Mohammad A. Naal, Emmanuel Simeu, Salvador Mir
   On-Line Testable Decimation Filter Design for AMS Systems. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2003, pp:83-88 [Conf]
   
7. Emmanuel Simeu, Ahmad Abdelhay
   A Robust Fault Detection Scheme for Concurrent Testing of Linear Digital Systems. [Citation Graph (0, 0)][DBLP]
   IOLTW, 2001, pp:209-214 [Conf]
   
8. Emmanuel Simeu, Salvador Mir, R. Kherreddine, H. N. Nguyen
   Envelope Detection Based Transition Time Supervision for Online Testing of RF MEMS Switches. [Citation Graph (0, 0)][DBLP]
   IOLTS, 2007, pp:237-243 [Conf]
   
9. Ahcène Bounceur, Salvador Mir, Luís Rolíndez, Emmanuel Simeu
   CAT platform for analogue and mixed-signal test evaluation and optimization. [Citation Graph (0, 0)][DBLP]
   VLSI-SoC, 2006, pp:320-325 [Conf]
   
10. Libor Rufer, Salvador Mir, Emmanuel Simeu, C. Domingues
    On-Chip Pseudorandom MEMS Testing. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:233-241 [Journal]
    
11. 
    Low Frequency Test for RF MEMS Switches. [Citation Graph (, )][DBLP]