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Ganesh Srinivasan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ganesh Srinivasan, Shalabh Goyal, Abhijit Chatterjee
    Reconfiguration for Enhanced ALternate Test (REALTest) of Analog Circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:302-307 [Conf]
  2. Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee
    Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:280-285 [Conf]
  3. Ganesh Srinivasan, Friedrich Taenzler, Abhijit Chatterjee
    Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:658-663 [Conf]
  4. Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee
    Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. [Citation Graph (0, 0)][DBLP]
    DELTA, 2004, pp:372-377 [Conf]
  5. Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee
    A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:289-294 [Conf]
  6. Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee
    System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:229-236 [Conf]
  7. Ganesh Srinivasan, Abhijit Chatterjee, Friedrich Taenzler
    Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:222-227 [Conf]
  8. Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee
    Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:323-339 [Journal]

  9. Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers. [Citation Graph (, )][DBLP]

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