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Vladimir Székely: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois
    Thermal Monitoring Of Safety-Critical Integrated Systems. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1996, pp:282-288 [Conf]
  2. Jean-Michel Karam, Bernard Courtois, Hicham Boutamine, P. Drake, A. Poppe, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
    CAD and Foundries for Microsystems. [Citation Graph (0, 0)][DBLP]
    DAC, 1997, pp:674-679 [Conf]
  3. Márta Rencz, Vladimir Székely, A. Poppe
    A Fast Algorithm for the Layout Based Electro-Thermal Simulation. [Citation Graph (0, 0)][DBLP]
    DATE, 2003, pp:11032-11037 [Conf]
  4. Vladimir Székely, Márta Rencz
    Fast Field Solvers for Thermal and Electrostatic Analysis. [Citation Graph (0, 0)][DBLP]
    DATE, 1998, pp:518-523 [Conf]
  5. György Bognár, Gyula Horváth, Zoltán Szucs, Vladimir Székely
    Die Attach Quality Testing by Fully Contact-less Measurement Method. [Citation Graph (0, 0)][DBLP]
    DDECS, 2006, pp:81-82 [Conf]
  6. Vladimir Székely, Márta Rencz
    Fast field solver-programs for thermal and electrostatic analysis of microsystem elements. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1997, pp:684-689 [Conf]
  7. Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner
    Design and Test of MEMs. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 1999, pp:270-0 [Conf]
  8. Vladimir Székely, Márta Rencz, Bernard Courtois
    Integrating on-chip temperature sensors into DfT schemes and BIST architectures. [Citation Graph (0, 0)][DBLP]
    VTS, 1997, pp:440-445 [Conf]
  9. Vladimir Székely, Márta Rencz, Bernard Courtois
    Tracing the Thermal Behavior of ICs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:2, pp:14-21 [Journal]
  10. Vladimir Székely
    Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03). [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2004, v:35, n:10, pp:789-790 [Journal]
  11. Vladimir Székely, A. Poppe, A. Pahi, A. Csendes, G. Hajas, Márta Rencz
    Electro-thermal and logi-thermal simulation of VLSI designs. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1997, v:5, n:3, pp:258-269 [Journal]
  12. Vladimir Székely, C. Marta, Z. Kohari, Márta Rencz
    CMOS sensors for on-line thermal monitoring of VLSI circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 1997, v:5, n:3, pp:270-276 [Journal]

  13. SISSSI-A tool for dynamic electro-thermal simulation of analog VLSI cells. [Citation Graph (, )][DBLP]

  14. Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array [Citation Graph (, )][DBLP]

  15. Characterization and Modeling of an Electro-thermal MEMS Structure [Citation Graph (, )][DBLP]

  16. Contactless Thermal Characterization of High Temperature Test Chamber [Citation Graph (, )][DBLP]

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