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Yukihiro Yamamoto: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Hiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu
    Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:216-221 [Conf]

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