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Yuxin Tian: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer
    Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:354-359 [Conf]

  2. A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects. [Citation Graph (, )][DBLP]


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