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Publications of Author

1. Tom Waayers, Erik Jan Marinissen, Maurice Lousberg
   IEEE Std 1500 Compliant Infrastructure forModular SOC Testing. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:450- [Conf]
   
2. Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
   Memory Testing Under Different Stress Conditions: An Industrial Evaluation. [Citation Graph (0, 0)][DBLP]
   DATE, 2005, pp:438-443 [Conf]
   
3. Alex Biewenga, Henk D. L. Hollmann, Frans de Jong, Maurice Lousberg
   Static component interconnect test technology (SCITT) a new technology for assembly testing. [Citation Graph (0, 0)][DBLP]
   ITC, 1999, pp:439-448 [Conf]
   
4. Camelia Hora, Rene Segers, Stefan Eichenberger, Maurice Lousberg
   An Effective Diagnosis Method to Support Yield Improvement. [Citation Graph (0, 0)][DBLP]
   ITC, 2002, pp:260-269 [Conf]
   
5. Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay
   CTL the language for describing core-based test. [Citation Graph (0, 0)][DBLP]
   ITC, 2001, pp:131-139 [Conf]
   
6. Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, Clemens Wouters
   A structured and scalable mechanism for test access to embedded reusable cores. [Citation Graph (0, 0)][DBLP]
   ITC, 1998, pp:284-293 [Conf]
   
7. Will Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg
   Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? [Citation Graph (0, 0)][DBLP]
   ITC, 2000, pp:95-104 [Conf]
   
8. Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel
   Wrapper design for embedded core test. [Citation Graph (0, 0)][DBLP]
   ITC, 2000, pp:911-920 [Conf]
   
9. Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti
   IP and Automation to Support IEEE P1500. [Citation Graph (0, 0)][DBLP]
   VTS, 2001, pp:411-412 [Conf]
   
10. Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg
    A New Algorithm for Dynamic Faults Detection in RAMs. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:177-182 [Conf]
    
11. Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
    Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:345-350 [Conf]
    
12. D. Arumi, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
    Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:145-150 [Conf]
    
13. Rosa Rodríguez-Montañés, D. Arumi, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
    Diagnosis of Full Open Defects in Interconnecting Lines. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:158-166 [Conf]
    
14. Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
    Memory Testing Under Different Stress Conditions: An Industrial Evaluation [Citation Graph (0, 0)][DBLP]
    CoRR, 2007, v:0, n:, pp:- [Journal]