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Yong B. Cho: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Baosheng Wang, Yong B. Cho, Sassan Tabatabaei, André Ivanov
    Yield, Overall Test Environment Timing Accuracy, and Defect Level Trade-Offs for High-Speed Interconnect Device Testing. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:348-353 [Conf]
  2. Yoshiyasu Takefuji, Robert J. Jannarone, Yong B. Cho, Tatung Chen
    Multinomial Conjunctoid Statistical Learning Machines. [Citation Graph (0, 0)][DBLP]
    ISCA, 1988, pp:12-17 [Conf]
  3. Yoshiyasu Takefuji, Kuo Chun Lee, Yong B. Cho
    Comments on 'O(n2) algorithms for graph planarization'. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:12, pp:1582-1583 [Journal]
  4. Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei
    A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:6, pp:621-630 [Journal]

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