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Jon Turino: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Hsin-Po Wang, Jon Turino
DFT and BIST techniques for the future. [Citation Graph (0, 0)][DBLP]
Asian Test Symposium, 2000, pp:6-7 [Conf] - Jon Turino
A Totally Universal Reset, Initialization (and) Nodal Observation Circuit. [Citation Graph (0, 0)][DBLP]
ITC, 1984, pp:878-884 [Conf] - Jon Turino
DFT: Profit or Loss -- A Position Paper. [Citation Graph (0, 0)][DBLP]
ITC, 1993, pp:269- [Conf] - Jon Turino
Design for test and time to market-friends or foes. [Citation Graph (0, 0)][DBLP]
ITC, 1999, pp:1098-1101 [Conf] - Jon Turino
Test Economics in the 21st Century. [Citation Graph (0, 0)][DBLP]
IEEE Design & Test of Computers, 1997, v:14, n:3, pp:41-44 [Journal] - Jon Turino
Design for Test and Time to Market: A Personal Perspective. [Citation Graph (0, 0)][DBLP]
IEEE Design & Test of Computers, 1999, v:16, n:3, pp:23-27 [Journal]
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