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Meng-Yao Liu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chin-Long Wey, Meng-Yao Liu
    Burn-In Stress Test of Analog CMOS ICs. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:360-365 [Conf]
  2. Shaolei Quan, Meng-Yao Liu, Chin-Long Wey
    Design of a CMOS Operational Amplifier Amenable to Extreme Voltage Stress. [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:563-572 [Conf]

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