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Adam Osseiran: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Chin-Long Wey, Adam Osseiran, José Luis Huertas, Yeon-Chen Nieu
    Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2000, pp:15-0 [Conf]
  2. Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
    Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:1184-1191 [Conf]
  3. Muhsen Aljada, Adam Osseiran, Kamal Alameh
    Catastrophic and Parametric Fault Modelling for Photonic Systems. [Citation Graph (0, 0)][DBLP]
    DELTA, 2006, pp:190-196 [Conf]
  4. Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song
    Analog and Mixed Signal BIST: Too Much, Too Little, Too Late? [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:175-176 [Conf]
  5. Adam Osseiran
    Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:116-0 [Journal]
  6. Muhsen Aljada, Kamal Alameh, Adam Osseiran, Khalid Al-Begain
    A Novel MicroPhotonic Structure for Optical Header Recognition. [Citation Graph (0, 0)][DBLP]
    VLSI-SoC, 2005, pp:209-219 [Conf]

  7. A Jittered-Sampling Correction Technique for ADCs. [Citation Graph (, )][DBLP]

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