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Publications of Author

1. Shiyi Xu, Jianhua Gao
   An Efficient Random-like Testing. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1998, pp:504-0 [Conf]
   
2. Shiyi Xu, Tukwasibwe Justaf Frank
   An Evaluation of Test Generation Algorithms for combinational Circuits. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1999, pp:63-69 [Conf]
   
3. Shiyi Xu, Peter Waignjo, Percy G. Dias, Bole Shi
   Testability Prediction for Sequential Circuits Using Neural Network. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 1997, pp:48-0 [Conf]
   
4. Shiyi Xu
   Non-exhaustive Parity Testing. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2001, pp:468- [Conf]
   
5. Shiyi Xu
   Build-In-Self-Test for Software. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2003, pp:220-223 [Conf]
   
6. Shiyi Xu
   A Systematic Way of Functional Testing for VLSI Chips. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2004, pp:170-175 [Conf]
   
7. Shiyi Xu
   Pseudo-Parity Testing with Testable Design. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:354-359 [Conf]
   
8. Shiyi Xu, Wei Cen
   Forecasting the efficiency of test generation algorithms for digital circuits. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2000, pp:179-0 [Conf]
   
9. Shiyi Xu, Jianwen Chen
   Maximum Distance Testing. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2002, pp:15-0 [Conf]
   
10. Shiyi Xu, Gercy P. Dias
    Testability forecasting for sequential circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:199-205 [Conf]
    
11. Shiyi Xu
    A New Approach to Improving the Test Effectiveness in Software Testing Using Fault Collapsing. [Citation Graph (0, 0)][DBLP]
    PRDC, 2006, pp:73-80 [Conf]
    
12. Shiyi Xu
    High-Order Syndrome Testing for VLSI Circuits. [Citation Graph (0, 0)][DBLP]
    PRDC, 2005, pp:101-108 [Conf]
    
13. Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian
    Design & Test Education in Asia. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:4, pp:331-338 [Journal]
    
14. Shiyi Xu, Tukwasibwe Justaf Frank
    Forecasting the Efficiency of Test Generation Algorithms for Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    J. Comput. Sci. Technol., 2000, v:15, n:4, pp:326-337 [Journal]
    
15. Shiyi Xu, Stephen Y. H. Su
    Detecting I/O and Internal Feedback Bridging Faults. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1985, v:34, n:6, pp:553-557 [Journal]
    
16. 
    An Accurate Model of Software Reliability. [Citation Graph (, )][DBLP]
    
    
17. 
    A Synthesis Software Reliability Model. [Citation Graph (, )][DBLP]
    
    
18. 
    Orderly Random Testing for Both Hardware and Software. [Citation Graph (, )][DBLP]