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Ming-Jing Chen: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Dong Xiang, Ming-Jing Chen, Hideo Fujiwara
    Using Weighted Scan Enable Signals to Improve the Effectiveness of Scan-Based BIST. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:126-131 [Conf]
  2. Dong Xiang, Ming-Jing Chen, Kai-Wei Li, Yu-Liang Wu
    Scan-Based BIST Using an Improved Scan Forest Architecture. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:88-93 [Conf]
  3. Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara
    Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:12-17 [Conf]
  4. Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara
    Improving test effectiveness of scan-based BIST by scan chain partitioning. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:6, pp:916-927 [Journal]

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