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Shan Gu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Dong Xiang, Shan Gu, Hideo Fujiwara
    Non-Scan Design for Testability Based on Fault Oriented Conflict Analysis. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2002, pp:86-0 [Conf]
  2. Dong Xiang, Shan Gu, Hideo Fujiwara
    Non-Scan Design for Testability for Mixed RTL Circuits with Both Data Paths and Controller via Conflict Analysis. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:300-305 [Conf]
  3. Dong Xiang, Shan Gu, Jia-Guang Sun, Yu-Liang Wu
    A cost-effective scan architecture for scan testing with non-scan test power and test application cost. [Citation Graph (0, 0)][DBLP]
    DAC, 2003, pp:744-747 [Conf]

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