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Xiangdong Xuan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh, Namsoo P. Kim, Mark T. Chisa
    IC Reliability Simulator ARET and Its Application in Design-for-Reliability. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2003, pp:18-23 [Conf]
  2. Xiangdong Xuan, Abhijit Chatterjee
    Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:323-328 [Conf]
  3. Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee
    Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:4-6, pp:471-482 [Journal]

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