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Koji Yamazaki: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Teruhiko Yamada, Toshinori Kotake, Hiroshi Takahashi, Koji Yamazaki
    Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1999, pp:269-274 [Conf]
  2. Teruhiko Yamada, Koji Yamazaki, Edward J. McCluskey
    A simple technique for locating gate-level faults in combinational circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1995, pp:65-70 [Conf]
  3. Koji Yamazaki, Teruhiko Yamada
    An approach to diagnose logical faults in partially observable sequential circuits. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 1997, pp:168-173 [Conf]
  4. Hiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato
    Effective Post-BIST Fault Diagnosis for Multiple Faults. [Citation Graph (0, 0)][DBLP]
    DFT, 2006, pp:401-109 [Conf]

  5. New Class of Tests for Open Faults with Considering Adjacent Lines. [Citation Graph (, )][DBLP]


  6. A Novel Approach for Improving the Quality of Open Fault Diagnosis. [Citation Graph (, )][DBLP]


  7. Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. [Citation Graph (, )][DBLP]


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