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Haihua Yan: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Haihua Yan, Adit D. Singh
    Reduce Yield Loss in Delay Defect Detection in Slack Interval. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:372-377 [Conf]
  2. Haihua Yan, Adit D. Singh, Gefu Xu
    Delay Defect Characterization Using Low Voltage Test. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2005, pp:8-13 [Conf]
  3. Haihua Yan, Gefu Xu, Adit D. Singh
    Low Voltage Test in Place of Fast Clock in DDSI Delay Test. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:316-320 [Conf]
  4. Haihua Yan, Adit D. Singh
    Experiments in Detecting Delay Faults using Multiple Higher Frequency Clocks and Results from Neighboring Die. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:105-111 [Conf]
  5. Haihua Yan, Adit D. Singh
    Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: A Simulation Study. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:242-251 [Conf]
  6. Haihua Yan, Adit D. Singh
    A Delay Test to Differentiate Resistive Interconnect Faults from Weak Transistor Defects. [Citation Graph (0, 0)][DBLP]
    VLSI Design, 2005, pp:47-52 [Conf]
  7. Anshuman Chandra, Haihua Yan, Rohit Kapur
    Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:84-92 [Conf]
  8. Haihua Yan, Adit D. Singh
    A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI). [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2006, v:14, n:11, pp:1216-1226 [Journal]

  9. Categorizing Software Engineering Knowledge Using a Combination of SWEBOK and Text Categorization. [Citation Graph (, )][DBLP]


  10. DECF: A Coarse-Grained Data-Parallel Programming Framework for Seismic Processing. [Citation Graph (, )][DBLP]


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