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Ken-ichi Yamaguchi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ken-ichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
    BIST Method Based on Concurrent Single-Control Testability of RTL Data Paths. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:313-318 [Conf]
  2. Zhiqiang You, Ken-ichi Yamaguchi, Michiko Inoue, Jacob Savir, Hideo Fujiwara
    Power-Constrained DFT Algorithms for Non-Scan BIST-able RTL Data Paths. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2004, pp:32-39 [Conf]

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