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Toshio Ikeda: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura, Yasuo Sato
    An Approach to Improve the Resolution of Defect-Based Diagnosis. [Citation Graph (0, 0)][DBLP]
    Asian Test Symposium, 2001, pp:123-0 [Conf]
  2. Yasuo Sato, Msaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto
    An evaluation of defect-oriented test: WELL-controlled low voltage test. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:1059-1067 [Conf]
  3. Yasuo Sato, Iwao Yamazaki, Hiroki Yamanaka, Toshio Ikeda, Masahiro Takakura
    A Persistent Diagnostic Technique for Unstable Defects. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:242-249 [Conf]

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