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Publications of Author

1. Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko
   Shortening Burn-In Test: Application of a Novel Approach in optimizing Burn-In Time using Weibull Statistical Analysis with HVST. [Citation Graph (0, 0)][DBLP]
   Asian Test Symposium, 2005, pp:472- [Conf]
   
2. Melanie Po-Leen Ooi
   Hardware Implementation for Face Detection on Xilinx Virtex-II FPGA using the Reversible Component Transformation Colour Space. [Citation Graph (0, 0)][DBLP]
   DELTA, 2006, pp:41-46 [Conf]
   
3. Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko
   Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:88-98 [Journal]
   
4. 
   Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices. [Citation Graph (, )][DBLP]
   
   
5. 
   Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers. [Citation Graph (, )][DBLP]
   
   
6. 
   Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers. [Citation Graph (, )][DBLP]
   
   
7. 
   Virtual Instrumentation Based IC Parametric Tester for Engineering Education. [Citation Graph (, )][DBLP]