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Eonjo Byun: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author


  1. Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. [Citation Graph (, )][DBLP]


  2. A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control. [Citation Graph (, )][DBLP]


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