Karl Fuchs, Michael Pabst, Torsten Rössel RESIST: a recursive test pattern generation algorithm for path delay faults considering various test classes. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:12, pp:1550-1562 [Journal]
RESIST: a recursive test pattern generation algorithm for path delay faults. [Citation Graph (, )][DBLP]
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