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Yue Hao: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Junping Wang, Yue Hao
    Short Critical Area Computational Method Using Mathematical Morphology. [Citation Graph (0, 0)][DBLP]
    CIS (2), 2005, pp:796-803 [Conf]
  2. Xiaohong Jiang, Susumu Horiguchi, Yue Hao
    Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core. [Citation Graph (0, 0)][DBLP]
    DFT, 2000, pp:30-0 [Conf]
  3. Tianxu Zhao, Xuchao Duan, Yue Hao, Peijun Ma
    Reliability Estimation Model of ICs Interconnect Based on Uniform Distribution of Defects on a Chip. [Citation Graph (0, 0)][DBLP]
    DFT, 2003, pp:11-17 [Conf]
  4. Tianxu Zhao, Yue Hao, Yongchang Jiao
    VLSI Yield Optimization Based on the Sub-Processing-Element Level Redundancy. [Citation Graph (0, 0)][DBLP]
    DFT, 2000, pp:41-46 [Conf]
  5. Tianxu Zhao, Yue Hao, Peijun Ma, Taifeng Chen
    Relation between Reliability and Yield of IC's Based on Discrete Defect Distribution Model. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:48-0 [Conf]
  6. Hongxia Ren, Yue Hao
    Study on the degradation induced by donor interface state in deep-sub-micron grooved-gate P-channel MOSFET's. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:4, pp:597-604 [Journal]
  7. Hongxia Liu, Yue Hao, Jiangang Zhu
    A thorough investigation of hot-carrier-induced gate oxide breakdown in partially depleted N- and P-channel SIMOX MOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:7, pp:1037-1044 [Journal]
  8. Ming-e Jing, Yue Hao, Jin-feng Zhang, Peijun Ma
    Efficient parametric yield optimization of VLSI circuit by uniform design sampling method. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2005, v:45, n:1, pp:155-162 [Journal]
  9. Daoguang Liu, Siliu Xu, Kaicheng Li, Jin Zhang, Rongkan Liu, Yukui Liu, Zhengfan Zhang, Gangyi Hu, Yue Hao
    Growth and quality control of MBE-based SiGe-HBT for amplifier applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:5-8, pp:587-589 [Journal]

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