Journals and Conferences that author prefers

Journals

1. J. Electronic Testing (8 paper(s))
2. IEEE Design & Test of Computers (5 paper(s))
3. IEEE Trans. on CAD of Integrated Circuits and Systems (3 paper(s))
4. Microelectronics Journal (2 paper(s))
5. Journal of Circuits, Systems, and Computers (1 paper(s))
6. J. Comput. Sci. Technol. (1 paper(s))

Conferences

1. Asian Test Symposium (14 paper(s))
2. IEEE VLSI Test Symposium (13 paper(s))
3. International Test Conference (ITC) (10 paper(s))
4. Design, Automation, and Test in Europe (6 paper(s))
5. (3 paper(s))
6. Workshop on Electronic Design, Test and Applications (3 paper(s))
7. (3 paper(s))
8. International On-Line Testing Symposium / Workshop (3 paper(s))
9. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
10. European Dependable Computing Conference (EDCC) (2 paper(s))
11. Field-Programmable Logic and Applications (FPL) (2 paper(s))
12. International Symposium on Fault-Tolerant Computing (FTCS) (1 paper(s))
13. IFIP WG10.5 (1 paper(s))
14. International Symposium on Quality Electronic Design (1 paper(s))
15. Annual Symposium on VLSI (1 paper(s))
16. VLSI Design (1 paper(s))