Journals and Conferences that author prefers

Journals

1. IEEE Trans. VLSI Syst. (4 paper(s))
2. IEEE Trans. Computers (3 paper(s))
3. IEEE Trans. on CAD of Integrated Circuits and Systems (3 paper(s))
4. ACM Trans. Design Autom. Electr. Syst. (2 paper(s))
5. Computers & Electrical Engineering (2 paper(s))
6. IEEE Design & Test of Computers (1 paper(s))
7. Journal of Circuits, Systems, and Computers (1 paper(s))
8. IEEE Trans. Pattern Anal. Mach. Intell. (1 paper(s))
9. Parallel Computing (1 paper(s))
10. VLSI Signal Processing (1 paper(s))

Conferences

1. IEEE International Symposium on Circuits and Systems (ISCAS) (43 paper(s))
2. (11 paper(s))
3. International Workshop System-on-Chip for Real-Time Applications (10 paper(s))
4. Defect and Fault Tolerance in VLSI Systems (9 paper(s))
5. Design, Automation, and Test in Europe (3 paper(s))
6. International Test Conference (ITC) (3 paper(s))
7. IEEE VLSI Test Symposium (3 paper(s))
8. ACM Great Lakes Symposium on VLSI (3 paper(s))
9. Field-Programmable Custom Computing Machines (FCCM) (2 paper(s))
10. International Conference on MEMS, NANO, and Smart Systems (ICMENS) (2 paper(s))
11. Asian Test Symposium (1 paper(s))
12. International Symposium on Quality Electronic Design (1 paper(s))
13. International Conference on Hardware Software Codesign (1 paper(s))
14. International Symposium on Systems Synthesis (1 paper(s))
15. Workshop on Electronic Design, Test and Applications (1 paper(s))
16. IEEE International Workshop on Rapid System Prototyping (1 paper(s))
17. European Design and Test Conference (EDAC) (1 paper(s))
18. (1 paper(s))
19. Symposium on Field Programmable Gate Arrays (FPGA) (1 paper(s))
20. International Conference on Computer Design (ICCD) (1 paper(s))
21. International On-Line Testing Symposium / Workshop (1 paper(s))