Journals in DBLP

IBM Journal of Research and Development
1984, volume: 28, number: 2

1. Chin-Long Chen, M. Y. (Ben) Hsiao
   Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:124-134 [Journal]
   
2. Glen G. Langdon Jr.
   An Introduction to Arithmetic Coding. [Citation Graph (1, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:135-149 [Journal]
   
3. Richard E. Blahut
   A Universal Reed-Solomon Decoder. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:150-158 [Journal]
   
4. Jean Arlat, William C. Carter
   Implementation and Evaluation of a (b, k)-Adjacent Error-Correcting/Detecting Scheme for Supercomputer Systems. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:159-169 [Journal]
   
5. Douglas C. Bossen, Chin-Long Chen, M. Y. (Ben) Hsiao
   Fault Alignment Exclusion for Memory Using Address Permutation. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:170-176 [Journal]
   
6. F. J. Aichelmann Jr.
   Fault-Tolerant Design Techniques for Semiconductor Memory Applications. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:177-183 [Journal]
   
7. C. L. Chen, Robert A. Rutledge
   Fault-Tolerant Memory Simulator. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:184-195 [Journal]
   
8. Marvin R. Libson, Harold E. Harvey
   A General-Purpose Memory Reliability Simulator. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:196-205 [Journal]
   
9. Thomas D. Howell
   Analysis of Correctable Errors in the IBM 3380 Disk File. [Citation Graph (0, 0)][DBLP]
   IBM Journal of Research and Development, 1984, v:28, n:2, pp:206-211 [Journal]
   
10. Donald T. Tang, C. L. Chen
    Iterative Exhaustive Pattern Generation for Logic Testing. [Citation Graph (0, 0)][DBLP]
    IBM Journal of Research and Development, 1984, v:28, n:2, pp:212-219 [Journal]