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Jens Pfeiffer: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Helmut Lang, Jens Pfeiffer, Jeff Maguire
    Using on-chip test pattern compression for full scan SoC designs. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:638-643 [Conf]

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