Pan Zhongliang Fault Detection for Testable Realizations of Multiple-Valued Logic Functions. [Citation Graph (0, 0)][DBLP] Asian Test Symposium, 2003, pp:242-249 [Conf]
Pan Zhongliang Bridging Fault Detections for Testable Realizations of Logic Functions. [Citation Graph (0, 0)][DBLP] VLSI Design, 2003, pp:423-0 [Conf]
Pan Zhongliang Neural Network Model for Testing Stuck-at and Delay Faults in Digital Circuit. [Citation Graph (0, 0)][DBLP] VLSI Design, 2004, pp:499-0 [Conf]
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